Harmonic and power balance tools for tapping-mode atomic force microscope
نویسندگان
چکیده
منابع مشابه
Harmonic and power balance tools for tapping-mode atomic force microscope
The atomic force microscope ~AFM! is a powerful tool for investigating surfaces at atomic scales. Harmonic balance and power balance techniques are introduced to analyze the tapping-mode dynamics of the atomic force microscope. The harmonic balance perspective explains observations hitherto unexplained in the AFM literature. A nonconservative model for the cantilever–sample interaction is devel...
متن کاملImaging bandwidth of the tapping mode atomic force microscope probe
János Kokavecz,1,* Othmar Marti,2 Péter Heszler,3,4 and Ádám Mechler5,† 1Department of Optics and Quantum Electronics, University of Szeged, P.O. Box 406, H-6701 Szeged, Hungary 2Department of Experimental Physics, University of Ulm, Albert-Einstein-Allee 11 D-89069 Ulm, Germany 3Research Group on Laser Physics of the Hungarian Academy of Sciences, P.O. Box 406, H-6701 Szeged, Hungary 4The Ångs...
متن کاملTapping mode atomic force microscopy in liquid
We show that standard silicon nitride cantilevers can be used for tapping mode atomic force microscopy (AFM) in air, provided that the energy of the oscillating cantilever is sufficiently high to overcome the adhesion of the water layer. The same cantilevers are successfully used for tapping mode AFhif in liquid. Acoustic modes in the liquid excite the canti1eve.r. On soft samples, e.g., biolog...
متن کاملDesign of Fractional Order Sliding Mode Controller for Chaos Suppression of Atomic Force Microscope System
A novel nonlinear fractional order sliding mode controller is proposed to control the chaotic atomic force microscope system in presence of uncertainties and disturbances. In the design of the suggested fractional order controller, conformable fractional order derivative is applied. The stability of the scheme is proved by means of the Lyapunov theory based on conformable fractional order deriv...
متن کاملNote: ferrule-top atomic force microscope. II. Imaging in tapping mode and at low temperature.
In a recent paper [D.Chavan et al., Rev. Sci. Instrum. 81, 123702 (2010)] we have demonstrated that ferrule-top cantilevers, obtained by carving the end of a ferruled fiber, can be used for contact mode atomic force microscopy in ambient conditions. Here we show that those probes can provide tapping mode images at both room and cryogenic temperatures (12 K).
متن کاملذخیره در منابع من
با ذخیره ی این منبع در منابع من، دسترسی به آن را برای استفاده های بعدی آسان تر کنید
ژورنال
عنوان ژورنال: Journal of Applied Physics
سال: 2001
ISSN: 0021-8979,1089-7550
DOI: 10.1063/1.1365440